X-Ray Diffractometer System


Name of the Instrument 

Powder X-Ray Diffractometer System

Make and Model of the Instrument 

Bruker, Germany.


Limit of detection 


Limit of quantification  


Instrument details 

Bruker's X-ray Diffraction and Scattering portfolio enables detailed analysis of any material from fundamental research to industrial quality control that includes, phase Identification, Quantitative Analysis, Crystal structure determination.

PDF analysis (total scattering), Small Angle X-Ray Scattering (SAXS), X-Ray Reflectometry (XRR), High Resolution X-Ray Diffraction (HRXRD), Reciprocal Space Mapping (RSM), Residual Stress

Texture (pole figures)

Sample requirement and sample preparation 

(Will update soon)

Proposed cost 

(Not decided yet)

Contact person and email 

Dr. Rambabu Dandela (r.dandela@iocb.ictmumbai.edu.in)