X-Ray Diffractometer System
Name of the Instrument
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Powder X-Ray Diffractometer System
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Make and Model of the Instrument
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Bruker, Germany.
D8 ADVANCE
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Limit of detection
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NA
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Limit of quantification
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NA
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Instrument details
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Bruker's X-ray Diffraction and Scattering portfolio enables detailed analysis of any material from fundamental research to industrial quality control that includes, phase Identification, Quantitative Analysis, Crystal structure determination.
PDF analysis (total scattering), Small Angle X-Ray Scattering (SAXS), X-Ray Reflectometry (XRR), High Resolution X-Ray Diffraction (HRXRD), Reciprocal Space Mapping (RSM), Residual Stress
Texture (pole figures)
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Sample requirement and sample preparation
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(Will update soon)
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Proposed cost
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(Not decided yet)
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Contact person and email
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Dr. Rambabu Dandela (r.dandela@iocb.ictmumbai.edu.in)
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