SEM Jeol



Name of the Instrument 

Scanning Electron Microscope with EDS system

Make and Model of the Instrument 


Limit of detection 

1 nm

Limit of quantification 

Characterization of nanomaterials and thin-films (size, shape, crystal lattice)

Instrument details 

JSM-7610F is an ultra-high resolution Schottky Field Emission Scanning Electron Microscope which has semi-in-lens objective lens. High power optics can provide high throughput and high performance analysis. It’s also suitable for high spatial resolution analysis. Furthermore, Gentle Beam mode can reduce the incident electron penetration to the specimen, enabling you to observe its topmost surface by using a few hundred landing energy. This instrument is suitable for a wide variety of analysis with EDS, WDS, CL etc.

Sample requirement and sample preparation 

(will update soon)

Proposed cost 

Not decided yet

Contact person and email 

Dr. Saikat Bhaumik (