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Instrument details
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JSM-7610F is an ultra-high resolution Schottky Field Emission Scanning Electron Microscope which has semi-in-lens objective lens. High power optics can provide high throughput and high performance analysis. It’s also suitable for high spatial resolution analysis. Furthermore, Gentle Beam mode can reduce the incident electron penetration to the specimen, enabling you to observe its topmost surface by using a few hundred landing energy. This instrument is suitable for a wide variety of analysis with EDS, WDS, CL etc.
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